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Items where Author is "Casteleiro, C."
Jump to: Article | Conference or Workshop Item Number of items: 5.
ArticleFantoni, A. and Fernandes, M. and Vieira, M. and Casteleiro, C. and Schwarz, R. (2009) a-Si:H p–i–n structures with extreme i-layer thickness. Thin Solid Films, 517 (23), pp. 6426-6429. ISSN 0040-6090. URL: http://dx.doi.org/10.1016/j.tsf.2009.02.073. Schwarz, R. and Mardolcar, U. and Vygranenko, Y. and Vieira, M. and Casteleiro, C. and STALLINGA, P. and GOMES, H. (2008) Photocapacitance measurements in irradiated a-Si:H based detectors. Journal of Non-Crystalline Solids, 354 (19-25), pp. 2176-2180. ISSN 0022-3093. URL: http://dx.doi.org/10.1016/j.jnoncrysol.2007.09.049. Casteleiro, C. and Schwarz, R. and Mardolcar, U. and Maçarico, A. and Martins, J. and Vieira, M. and Wuensch, F. and Kunst, M. and Morgado, E. and Stallinga, P. and Gomes, H. (2008) Spatially-resolved photocapacitance measurements to study defects in a-Si:H based p–i–n particle detectors. Thin Solid Films, 516 (15), pp. 5118-5121. ISSN 0040-6090. URL: http://dx.doi.org/10.1016/j.tsf.2008.01.012. Morgado, E. and Schwarz, R. and Braz, T. and Casteleiro, C. and Maçarico, A. and Vieira, Manuela and Alves, E. (2006) Radiation-induced defects in a-Si:H by 1.5 MeV He4 particles studied by photoconductivity and photothermal deflection spectroscopy. Journal of Non-Crystalline Solids (352), pp. 1071-1074. Conference or Workshop ItemCasteleiro, C. and Schwarz, R. and Maçarico, A. and Martins, J. and Vieira, Manuela and Wuensch, F. (2006) Spacially-Resolved Photocapacitance Measurements to Study Defects in a-Si:H Based p-i-n Particle Detectors. [Other]. In: European MRS Meeting, May/June 2006, Nice, France. |
