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Items where Author is "Kunst, M."
Jump to: Article | Conference or Workshop Item Number of items: 2.
ArticleCasteleiro, C. and Schwarz, R. and Mardolcar, U. and Maçarico, A. and Martins, J. and Vieira, M. and Wuensch, F. and Kunst, M. and Morgado, E. and Stallinga, P. and Gomes, H. (2008) Spatially-resolved photocapacitance measurements to study defects in a-Si:H based p–i–n particle detectors. Thin Solid Films, 516 (15), pp. 5118-5121. ISSN 0040-6090. URL: http://dx.doi.org/10.1016/j.tsf.2008.01.012. Conference or Workshop ItemSchwarz, R. and Braz, T. and Sanguino, P. and Maçarico, F. and Vieira, Manuela and Fernandes, M. and Wunsch, F. and Kunst, M. and Marques, C. P. and Alves, E. and Louro, P. and Mendes, C. and Vygranenko, Yu (2004) Changes in spectral response of thick amorphous silicon detectors after irradiation. [Paper]. In: 3rd aSinet workshop, February 25-27, 2004, Bratislava, Sloven. |
