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Items where Author is "Wuensch, F."
Jump to: Article | Conference or Workshop Item Number of items: 2.
ArticleCasteleiro, C. and Schwarz, R. and Mardolcar, U. and Maçarico, A. and Martins, J. and Vieira, M. and Wuensch, F. and Kunst, M. and Morgado, E. and Stallinga, P. and Gomes, H. (2008) Spatially-resolved photocapacitance measurements to study defects in a-Si:H based p–i–n particle detectors. Thin Solid Films, 516 (15), pp. 5118-5121. ISSN 0040-6090. URL: http://dx.doi.org/10.1016/j.tsf.2008.01.012. Conference or Workshop ItemCasteleiro, C. and Schwarz, R. and Maçarico, A. and Martins, J. and Vieira, Manuela and Wuensch, F. (2006) Spacially-Resolved Photocapacitance Measurements to Study Defects in a-Si:H Based p-i-n Particle Detectors. [Other]. In: European MRS Meeting, May/June 2006, Nice, France. |
